Proceedings /

Proceedings /

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书目详细资料
上一标题:International Test Conference. Digest of papers
企业作者: International Test Conference, IEEE Computer Society. Test Technology Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
格式: 会议录 杂志
语言:English
出版: Silver Spring, Md. : IEEE Computer Society Press, 1983-.
主题:
Computer storage devices > Congresses.
Integrated circuits > Testing > Congresses.
Semiconductors > Testing > Congresses.
实物特征
出版:1983-
Item Description:Each conference also has distinctive title.
实物描述:v. : ill. ; 28 cm.
ISSN:1089-3539
0743-1686

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