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| LEADER |
01507cas a2200361 a 4500 |
| 001 |
c000291874 |
| 003 |
CARM |
| 005 |
20090512141903.0 |
| 008 |
881216c19839999mduar p 0 a0eng d |
| 019 |
1 |
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|a 6151093
|5 LACONCORD2021
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| 022 |
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|a 1089-3539
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| 035 |
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|a (OCoLC)10342268
|5 LACONCORD2021
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| 040 |
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|a NUN:P
|b eng
|c NUN:P
|d NUN
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| 082 |
0 |
4 |
|a 621.38173
|2 19
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| 111 |
2 |
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|a International Test Conference
|
| 245 |
1 |
0 |
|a Proceedings /
|c International Test Conference.
|
| 246 |
3 |
4 |
|a IEEE ... Test Conference
|
| 260 |
|
|
|a Silver Spring, Md. :
|b IEEE Computer Society Press,
|c 1983-.
|
| 300 |
|
|
|a v. :
|b ill. ;
|c 28 cm.
|
| 362 |
0 |
|
|a 1983-
|
| 500 |
|
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|a Each conference also has distinctive title.
|
| 550 |
|
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|a Sponsored by: IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEE.
|
| 650 |
|
0 |
|a Computer storage devices
|v Congresses.
|
| 650 |
|
0 |
|a Integrated circuits
|x Testing
|v Congresses.
|
| 650 |
|
0 |
|a Semiconductors
|x Testing
|v Congresses.
|
| 710 |
2 |
|
|a IEEE Computer Society.
|b Test Technology Committee
|
| 710 |
2 |
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|a Institute of Electrical and Electronics Engineers.
|b Philadelphia Section
|
| 780 |
0 |
0 |
|a International Test Conference.
|t Digest of papers
|x 0743-1686
|
| 852 |
8 |
|
|b CARM
|h A3:AE22D0
|i F06353
|p 0528181
|f SE
|
| 866 |
|
0 |
|a 22(1991)
|
| 866 |
|
0 |
|a 22(1991)
|
| 999 |
f |
f |
|i a4ff196f-d7a2-53b8-aceb-6325bb02b0fd
|s 65016741-6633-5181-8a3e-38225aecf644
|
| 952 |
f |
f |
|p Can circulate
|a CAVAL
|b CAVAL
|c CAVAL
|d CARM 1 Store
|e F06353
|f A3:AE22D0
|h Other scheme
|i book
|k 22(1991)
|m 0528181
|