Schuster, C. E. (1995). Test structure implementation document: DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs). U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O..

Schuster, C. E. Test Structure Implementation Document: DC Parametric Test Structures and Test Methods for Monolithic Microwave Integrated Circuits (MMICs). Gaithersburg, MD : Washington, DC: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1995.

Schuster, C. E. Test Structure Implementation Document: DC Parametric Test Structures and Test Methods for Monolithic Microwave Integrated Circuits (MMICs). U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1995.