Test structure implementation document : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) /
Shranjeno v:
| Glavni avtor: | |
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| Corporate Authors: | , |
| Format: | Knjiga |
| Jezik: | English |
| Izdano: |
Gaithersburg, MD : Washington, DC :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1995.
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| Serija: | Semiconductor measurement technology
NIST special publication. |
| Teme: |
CARM 1 Store
| Signatura: |
A3:AE31E0 F06481 |
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| Kopija 1 | Prosto Rezerviraj |