Test structure implementation document : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) /

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التفاصيل البيبلوغرافية
المؤلف الرئيسي:	Schuster, C. E.
مؤلفون مشاركون:	United States. Defense Advanced Research Projects Agency, U.S. Air Force Wright Laboratory
التنسيق:	كتاب
اللغة:	English
منشور في:	Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1995.
سلاسل:	Semiconductor measurement technology NIST special publication.
الموضوعات:	Microwave integrated circuits > Design > Data processing. Gallium arsenide semiconductors > Design > Data processing. Computer-aided design.

الوصف
وصف المادة:	"September 1995."
وصف مادي:	iv, 88 p. : ill. ; 28 cm.
بيبلوغرافيا:	Includes bibliographical references (p. 14)

مواد مشابهة