Test structure implementation document : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) /
Wedi'i Gadw mewn:
| Prif Awdur: | |
|---|---|
| Awduron Corfforaethol: | , |
| Fformat: | Llyfr |
| Iaith: | English |
| Cyhoeddwyd: |
Gaithersburg, MD : Washington, DC :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1995.
|
| Cyfres: | Semiconductor measurement technology
NIST special publication. |
| Pynciau: |
| LEADER | 01758cam a2200349 a 4500 | ||
|---|---|---|---|
| 001 | c000292110 | ||
| 003 | CARM | ||
| 005 | 20090518142510.0 | ||
| 008 | 960327s1995 mdua b f000 0 eng | ||
| 010 | |a 96130484 | ||
| 019 | 1 | |a 12356979 |5 LACONCORD2021 | |
| 035 | |a (OCoLC)34776187 |5 LACONCORD2021 | ||
| 040 | |a LC |b eng |c LC |d NUN | ||
| 050 | 0 | 0 | |a QC100 |b .U57 no. 400-97 |a TK7876 |
| 100 | 1 | |a Schuster, C. E. | |
| 245 | 0 | 0 | |a Test structure implementation document : |b DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) / |c C.E. Schuster ; sponsored by Defense Advanced Research Projects Agency and U.S. Air Force Wright Laboratory. |
| 260 | |a Gaithersburg, MD : |b U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; |a Washington, DC : |b For sale by the Supt. of Docs., U.S. G.P.O., |c 1995. | ||
| 300 | |a iv, 88 p. : |b ill. ; |c 28 cm. | ||
| 490 | 1 | 0 | |a Semiconductor measurement technology |
| 490 | 1 | 0 | |a NIST special publication. |v 400-97 |
| 500 | |a "September 1995." | ||
| 504 | |a Includes bibliographical references (p. 14) | ||
| 650 | 0 | |a Microwave integrated circuits |x Design |x Data processing. | |
| 650 | 0 | |a Gallium arsenide semiconductors |x Design |x Data processing. | |
| 650 | 0 | |a Computer-aided design. | |
| 710 | 1 | |a United States. |b Defense Advanced Research Projects Agency | |
| 710 | 2 | |a U.S. Air Force Wright Laboratory | |
| 830 | 0 | |a Semiconductor measurement technology | |
| 830 | 0 | |a NIST special publication. |n 400-97 | |
| 852 | 8 | |b CARM |h A3:AE31E0 |i F06481 |p 0516468 |f BK | |
| 999 | f | f | |i ddfa84d7-f048-50c8-b8a9-3b181887ff70 |s 8b0b8954-e209-56f6-9d6e-68420ac23fd0 |
| 952 | f | f | |p Can circulate |a CAVAL |b CAVAL |c CAVAL |d CARM 1 Store |e F06481 |f A3:AE31E0 |h Other scheme |i book |m 0516468 |