Test structure implementation document : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) /
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| Hlavní autor: | |
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| Korporace: | , |
| Médium: | Kniha |
| Jazyk: | English |
| Vydáno: |
Gaithersburg, MD : Washington, DC :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1995.
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| Edice: | Semiconductor measurement technology
NIST special publication. |
| Témata: |
CARM 1 Store
| Signatura: |
A3:AE31E0 F06481 |
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| Jednotka 1 | Dostupné Požadavek |