Test structure implementation document : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) /
Saved in:
| Main Author: | |
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| Corporate Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Gaithersburg, MD : Washington, DC :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1995.
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| Series: | Semiconductor measurement technology
NIST special publication. |
| Subjects: |
CARM 1 Store
| Call Number: |
A3:AE31E0 F06481 |
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| Copy 1 | Available Place a Hold |