Test structure implementation document : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) /

Test structure implementation document : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) /

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Detalles Bibliográficos
Autor principal: Schuster, C. E.
Autores Corporativos: United States. Defense Advanced Research Projects Agency, U.S. Air Force Wright Laboratory
Formato: Libro
Lenguaje:English
Publicado: Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1995.
Colección:Semiconductor measurement technology
NIST special publication.
Materias:
Microwave integrated circuits > Design > Data processing.
Gallium arsenide semiconductors > Design > Data processing.
Computer-aided design.

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