Test structure implementation document : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) /

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書目詳細資料
主要作者: Schuster, C. E.
Corporate Authors: United States. Defense Advanced Research Projects Agency, U.S. Air Force Wright Laboratory
格式: 圖書
語言:English
出版: Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1995.
叢編:Semiconductor measurement technology
NIST special publication.
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索引號: A3:AE31E0 F06481
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