Database for and statistical analysis of the interlaboratory determination of the conversion coefficient for the measurement of the interstitial oxygen content of silicon by infrared absorption /

Database for and statistical analysis of the interlaboratory determination of the conversion coefficient for the measurement of the interstitial oxygen content of silicon by infrared absorption /

Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Awdur Corfforaethol: National Institute of Standards and Technology (U.S.)
Awduron Eraill: Baghdadi, A., Scace, Robert I., Walters, E. Jane
Fformat: Llyfr
Iaith:English
Cyhoeddwyd: Gaithersburg, Md. : Washington, DC : U.S. Dept. of Commerce, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1989.
Cyfres:Semiconductor measurement technology
NIST special publication ; 400-82
Pynciau:
Silicon > Measurement > Databases.
Silicon > Measurement > Statistical methods.
Oxygen > Measurement > Databases.
Oxygen > Measurement > Statistical methods.
Infrared spectroscopy > Databases.
Infrared spectroscopy > Statistical methods.

CARM 1 Store

Manylion daliadau o CARM 1 Store
Rhif Galw: A3:AE31C0 F06472
Copi 1 Ar gael  Gwneud Cais

Eitemau Tebyg