Version 2.0 of the TXYZ thermal analysis program, TXYZ20 /
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| 主要作者: | |
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| 企业作者: | |
| 格式: | 图书 |
| 语言: | English |
| 出版: |
Gaithersburg, MD : Washington, DC :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1992.
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| 丛编: | Semiconductor measurement technology
NIST special publication ; 400-89 |
| 主题: |
| Item Description: | "June 1992." |
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| 实物描述: | iii, 29 p. ; 28 cm. |
| 参考书目: | Includes bibliographical references (p. 18) |