Version 2.0 of the TXYZ thermal analysis program, TXYZ20 /
Guardat en:
| Autor principal: | |
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| Autor corporatiu: | |
| Format: | Llibre |
| Idioma: | English |
| Publicat: |
Gaithersburg, MD : Washington, DC :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1992.
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| Col·lecció: | Semiconductor measurement technology
NIST special publication ; 400-89 |
| Matèries: |
CARM 1 Store
| Signatura: |
A3:AE31C0 F06472 |
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| Còpia 1 | Disponible Fer una reserva |