Version 2.0 of the TXYZ thermal analysis program, TXYZ20 /
Wedi'i Gadw mewn:
| Prif Awdur: | |
|---|---|
| Awdur Corfforaethol: | |
| Fformat: | Llyfr |
| Iaith: | English |
| Cyhoeddwyd: |
Gaithersburg, MD : Washington, DC :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1992.
|
| Cyfres: | Semiconductor measurement technology
NIST special publication ; 400-89 |
| Pynciau: |
CARM 1 Store
| Rhif Galw: |
A3:AE31C0 F06472 |
|---|---|
| Copi 1 | Ar gael Gwneud Cais |