Evaluating a chip, wafer, or lot using SUXES, SPICE, and STAT2 /

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Dettagli Bibliografici
Autore principale:	Marshall, J. C. (Janet C.)
Ente Autore:	National Institute of Standards and Technology (U.S.)
Altri autori:	Mattis, Richard L.
Natura:	Libro
Lingua:	English
Pubblicazione:	Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1992.
Serie:	Semiconductor measurement technology NIST special publication ; 400-90
Soggetti:	SPICE (Computer file) Metal oxide semiconductors, Complementary > Computer simulation.

Descrizione
Descrizione del documento:	"April 1992."
Descrizione fisica:	iv, 140 p. : ill. ; 28 cm.
Bibliografia:	Includes bibliographical references (p. 41-42)

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