Interferometry--surface characterization and testing : 24 July 1992, San Diego, California /
Sparad:
| Institutionell upphovsman: | |
|---|---|
| Övriga upphovsmän: | , |
| Materialtyp: | Bok |
| Språk: | English |
| Publicerad: |
Bellingham, Wash. :
SPIE,
c1992.
|
| Serie: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 1776. |
| Ämnen: |
CARM 1 Store
| Signum: |
A3:AE29C0 F06463 |
|---|---|
| Exemplar 1 | Tillgänglig Reservera |