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Interferometry--surface characterization and testing : 24 July 1992, San Diego, California /

Interferometry--surface characterization and testing : 24 July 1992, San Diego, California /

Guardat en:
Dades bibliogràfiques
Autor corporatiu: Society of Photo-optical Instrumentation Engineers
Altres autors: Creath, Katherine, Greivenkamp, John E.
Format: Llibre
Idioma:English
Publicat: Bellingham, Wash. : SPIE, c1992.
Col·lecció:Proceedings of SPIE--the International Society for Optical Engineering ; v. 1776.
Matèries:
Surfaces (Technology) > Testing > Congresses.
Surfaces (Technology) > Optical properties > Congresses.
Interferometry > Congresses.
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