Interferometry--surface characterization and testing : 24 July 1992, San Diego, California /
Saved in:
| Institution som forfatter: | |
|---|---|
| Andre forfattere: | , |
| Format: | Bog |
| Sprog: | English |
| Udgivet: |
Bellingham, Wash. :
SPIE,
c1992.
|
| Serier: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 1776. |
| Fag: |
| Fysisk beskrivelse: | vii, 183 p. : ill. ; 28 cm. |
|---|---|
| Bibliografi: | Includes bibliographical references and index. |
| ISBN: | 0819409499 |