Interferometry--surface characterization and testing : 24 July 1992, San Diego, California /

Gespeichert in:
Bibliographische Detailangaben
Körperschaft: Society of Photo-optical Instrumentation Engineers
Weitere Verfasser: Creath, Katherine, Greivenkamp, John E.
Format: Buch
Sprache:English
Veröffentlicht: Bellingham, Wash. : SPIE, c1992.
Schriftenreihe:Proceedings of SPIE--the International Society for Optical Engineering ; v. 1776.
Schlagworte:
LEADER 01592cam a2200349 a 4500
001 c000292248
003 CARM
005 20090525083948.0
008 930430s1992 waua b 101 0 eng d
010 |a 92085390 
019 1 |a 9944473  |5 LACONCORD2021 
020 |a 0819409499 
035 |a (OCoLC)27255547  |5 LACONCORD2021 
040 |a LC  |b eng  |c LC  |d LC  |d VCAV 
042 |a lccopycat 
050 0 0 |a TA418.7  |b .I525 1992 
082 0 4 |a 620.44  |2 20 
245 0 0 |a Interferometry--surface characterization and testing :  |b 24 July 1992, San Diego, California /  |c Katherine Creath, John E. Greivenkamp, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering. 
260 |a Bellingham, Wash. :  |b SPIE,  |c c1992. 
300 |a vii, 183 p. :  |b ill. ;  |c 28 cm. 
490 1 |a Proceedings / SPIE--the International Society for Optical Engineering ;  |v v. 1776 
504 |a Includes bibliographical references and index. 
650 0 |a Surfaces (Technology)  |x Testing  |v Congresses. 
650 0 |a Surfaces (Technology)  |x Optical properties  |v Congresses. 
650 0 |a Interferometry  |v Congresses. 
700 1 |a Creath, Katherine. 
700 1 |a Greivenkamp, John E. 
710 2 |a Society of Photo-optical Instrumentation Engineers. 
830 0 |a Proceedings of SPIE--the International Society for Optical Engineering ;  |v v. 1776. 
852 8 |b CARM  |h A3:AE29C0  |i F06463  |p 0527674  |f BK 
999 f f |i 6bca8689-e517-5bff-8a57-2392e0d718e7  |s 55f63d40-ee77-5138-bed8-5f05aa2b8134 
952 f f |p Can circulate  |a CAVAL  |b CAVAL  |c CAVAL  |d CARM 1 Store  |e F06463  |f A3:AE29C0  |h Other scheme  |i book  |m 0527674