Society of Photo-optical Instrumentation Engineers, Young, M., & Greivenkamp, J. E. (1989). Surface characterization and testing II: 10-11 August 1989, San Diego, California. SPIE--the International Society for Optical Engineering.
Цитирование в стиле Чикаго (17-е изд.)Society of Photo-optical Instrumentation Engineers, Matt Young, и John E. Greivenkamp. Surface Characterization and Testing II: 10-11 August 1989, San Diego, California. Bellingham, Wash., USA: SPIE--the International Society for Optical Engineering, 1989.
Цитирование MLA (8-е изд.)Society of Photo-optical Instrumentation Engineers, et al. Surface Characterization and Testing II: 10-11 August 1989, San Diego, California. SPIE--the International Society for Optical Engineering, 1989.
Предупреждение: эти цитированмия не могут быть всегда правильны на 100%.