Surface characterization and testing II : 10-11 August 1989, San Diego, California /
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| Corporate Author: | |
|---|---|
| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE--the International Society for Optical Engineering,
c1989.
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 1164. |
| Subjects: |
| Item Description: | "Sponsored by SPIE--the International Society for Optical Engineering." |
|---|---|
| Physical Description: | vi, 271 p. : ill. ; 28 cm. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0819402001 |