Surface characterization and testing II : 10-11 August 1989, San Diego, California /
Gardado en:
| Autor Corporativo: | |
|---|---|
| Outros autores: | , |
| Formato: | Libro |
| Idioma: | English |
| Publicado: |
Bellingham, Wash., USA :
SPIE--the International Society for Optical Engineering,
c1989.
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 1164. |
| Subjects: |
| descrición da copia: | "Sponsored by SPIE--the International Society for Optical Engineering." |
|---|---|
| Descrición Física: | vi, 271 p. : ill. ; 28 cm. |
| Bibliografía: | Includes bibliographical references and index. |
| ISBN: | 0819402001 |