Interferometry VII : techniques and analysis : 11-12 July 1995, San Diego, California /
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| Corporate Authors: | , |
|---|---|
| Other Authors: | , , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash. :
SPIE,
c1995.
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 2544. |
| Subjects: |
| Item Description: | "Consisted of two conferences dedicated to techniques and analysis, and applications."--Introd. "Cooperating organization, SEM--Society for Experimental Mechanics." |
|---|---|
| Physical Description: | x, 398 p. : ill. ; 28 cm. |
| Bibliography: | Includes bibliographic references and index. |
| ISBN: | 0819419036 |