Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script /
Saved in:
| Main Author: | |
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| Format: | Government Document Book |
| Language: | English |
| Published: |
Washington :
U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off,
1976.
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| Series: | NBS special publication ;
400-26. |
| Subjects: |
CARM 1 Store
| Call Number: |
A3:AF35E0 F07362 |
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| Copy 1 | Available Place a Hold |