Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script /

Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script /

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Bibliographic Details
Main Author: Buehler, Martin G.
Format: Government Document Book
Language:English
Published: Washington : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off, 1976.
Series:NBS special publication ; 400-26.
Subjects:
Capacitors > Defects.
Cryostats.
Electric measurements.
Semiconductors > Junctions > Defects.
Description
Physical Description:iii, 14 p. : ill ; 26 cm.
Bibliography:Bibliography: p. 14.

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