International Symposium on Electron Microscopy /
This symposium was held in conjunction with the celebration of the 10th anniversary of the Chinese Electron Microscopy Society.
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| Corporate Authors: | , |
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| Other Authors: | , |
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Teaneck, N.J. :
World Scientific,
1990.
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| Subjects: |
CARM 1 Store
| Call Number: |
A3:AF24F0 C12423 |
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| Copy 1 | Available Place a Hold |