International Symposium on Electron Microscopy /

This symposium was held in conjunction with the celebration of the 10th anniversary of the Chinese Electron Microscopy Society.

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Detalhes bibliográficos
Corporate Authors: International Symposium on Electron Microscopy Beijing, Chinese Electron Microscopy Society
Outros Autores: Kuo, Kehsin, Yao, Junen
Formato: Conference Proceeding Livro
Idioma:English
Publicado em: Teaneck, N.J. : World Scientific, 1990.
Assuntos:
Descrição
Resumo:This symposium was held in conjunction with the celebration of the 10th anniversary of the Chinese Electron Microscopy Society.
Descrição Física:xii, 478 p. : ill. ; 23 cm.
Bibliografia:Includes bibliographies.
ISBN:9810205317