International Symposium on Electron Microscopy /
This symposium was held in conjunction with the celebration of the 10th anniversary of the Chinese Electron Microscopy Society.
Zapisane w:
| organizacja autorów: | , |
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| Kolejni autorzy: | , |
| Format: | Materiały konferencyjne Książka |
| Język: | English |
| Wydane: |
Teaneck, N.J. :
World Scientific,
1990.
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| Hasła przedmiotowe: |
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| 001 | c000302701 | ||
| 003 | CARM | ||
| 005 | 20061111044401.0 | ||
| 008 | 910826s1990 nju 0 eng d | ||
| 019 | 1 | |a 69846995 |5 LACONCORD2021 | |
| 020 | |a 9810205317 | ||
| 035 | |a (OCoLC)1268109004 |5 LACONCORD2021 | ||
| 082 | 0 | 4 | |a 502.82506 |
| 111 | 2 | |a International Symposium on Electron Microscopy |d (1990 : |c Beijing) | |
| 240 | 1 | 0 | |a Proceedings. |
| 245 | 1 | 0 | |a International Symposium on Electron Microscopy / |c edited by Kehsin Kuo and Junen Yao. |
| 260 | |a Teaneck, N.J. : |b World Scientific, |c 1990. | ||
| 300 | |a xii, 478 p. : |b ill. ; |c 23 cm. | ||
| 504 | |a Includes bibliographies. | ||
| 520 | 8 | |a This symposium was held in conjunction with the celebration of the 10th anniversary of the Chinese Electron Microscopy Society. | |
| 650 | 0 | |a Electron microscopy |x Congresses. | |
| 700 | 1 | 0 | |a Kuo, Kehsin. |
| 700 | 1 | 0 | |a Yao, Junen. |
| 710 | 2 | |a Chinese Electron Microscopy Society. | |
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