International Symposium on Electron Microscopy /

This symposium was held in conjunction with the celebration of the 10th anniversary of the Chinese Electron Microscopy Society.

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Opis bibliograficzny
organizacja autorów: International Symposium on Electron Microscopy Beijing, Chinese Electron Microscopy Society
Kolejni autorzy: Kuo, Kehsin, Yao, Junen
Format: Materiały konferencyjne Książka
Język:English
Wydane: Teaneck, N.J. : World Scientific, 1990.
Hasła przedmiotowe:
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035 |a (OCoLC)1268109004  |5 LACONCORD2021 
082 0 4 |a 502.82506 
111 2 |a International Symposium on Electron Microscopy  |d (1990 :  |c Beijing) 
240 1 0 |a Proceedings. 
245 1 0 |a International Symposium on Electron Microscopy /  |c edited by Kehsin Kuo and Junen Yao. 
260 |a Teaneck, N.J. :  |b World Scientific,  |c 1990. 
300 |a xii, 478 p. :  |b ill. ;  |c 23 cm. 
504 |a Includes bibliographies. 
520 8 |a This symposium was held in conjunction with the celebration of the 10th anniversary of the Chinese Electron Microscopy Society. 
650 0 |a Electron microscopy  |x Congresses. 
700 1 0 |a Kuo, Kehsin. 
700 1 0 |a Yao, Junen. 
710 2 |a Chinese Electron Microscopy Society. 
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