Physical aspects of electron microscopy and microbeam analysis /
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| Corporate Authors: | , |
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| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
New York :
Wiley,
[1975].
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| Subjects: |
| Item Description: | Expanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973. "A Wiley biomedical-health publication.". |
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| Physical Description: | xiii, 474 p. : ill. ; 26 cm. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0471790206 |