Reliability stress and failure rate data for electronic equipment.

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Bibliographic Details
Corporate Author: United States. Department of Defense
Format: Book
Language:English
Published: Washington, D.C. : Department of Defense, 1965.
Series:Military handbook (United States. Dept. of Defense)
Subjects:
Description
Item Description:Supersedes Mil-Hdbk-217.
Physical Description:1v. (various pagings) : ill. ; 27 cm.