Reliability stress and failure rate data for electronic equipment.
Saved in:
| Corporate Author: | |
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| Format: | Book |
| Language: | English |
| Published: |
Washington, D.C. :
Department of Defense,
1965.
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| Series: | Military handbook (United States. Dept. of Defense)
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| Subjects: |
CARM 1 Store
| Copy 1 | Available Place a Hold |
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