Analog signal generation for built-in-self-test of mixed-signal integrated circuits /
Enregistré dans:
| Auteur principal: | |
|---|---|
| Autres auteurs: | |
| Format: | Livre |
| Langue: | English |
| Publié: |
Boston, Mass. :
Kluwer Academic Publishers,
c1995.
|
| Collection: | Kluwer international series in engineering and computer science. Analog circuits and signal processing
Kluwer international series in engineering and computer science ; SECS 312. |
| Sujets: | |
| Accès en ligne: | Publisher description Table of contents only |
Internet
Publisher descriptionTable of contents only
CARM 1 Store
| Exemplaire 1 | Disponible Réserver |
|---|