Analog signal generation for built-in-self-test of mixed-signal integrated circuits /

Analog signal generation for built-in-self-test of mixed-signal integrated circuits /

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Opis bibliograficzny
1. autor: Roberts, Gordon W., 1959-
Kolejni autorzy: Lu, Albert K., 1969-
Format: Książka
Język:English
Wydane: Boston, Mass. : Kluwer Academic Publishers, c1995.
Seria:Kluwer international series in engineering and computer science. Analog circuits and signal processing
Kluwer international series in engineering and computer science ; SECS 312.
Hasła przedmiotowe:
Signal generators > Design and construction.
Integrated circuits > Design and construction.
Integrated circuits > Testing.
Signal processing > Digital techniques.
Mixed signal circuits > Design and construction.
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