HOTPAC, programs for thermal analysis including version 3.0 of the TXYZ program, TXYZ 30, and the thermal multilayer program, TML /
Gorde:
| Egile nagusia: | |
|---|---|
| Erakunde egilea: | |
| Formatua: | Liburua |
| Hizkuntza: | English |
| Argitaratua: |
Gaithersburg, MD : Washington, DC :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1995.
|
| Saila: | NIST special publication ;
400-96. Semiconductor measurement technology. |
| Gaiak: |
CARM 1 Store
| Sailkapena: |
A3:AE21D0 F06324 |
|---|---|
| Alea 1 | Eskuragarri Erreserbatu |