HOTPAC, programs for thermal analysis including version 3.0 of the TXYZ program, TXYZ 30, and the thermal multilayer program, TML /
保存先:
| 第一著者: | |
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| 団体著者: | |
| フォーマット: | 図書 |
| 言語: | English |
| 出版事項: |
Gaithersburg, MD : Washington, DC :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1995.
|
| シリーズ: | NIST special publication ;
400-96. Semiconductor measurement technology. |
| 主題: |
CARM 1 Store
| 請求記号: |
A3:AE21D0 F06324 |
|---|---|
| 所蔵 1 | 利用可 予約する |