HOTPAC, programs for thermal analysis including version 3.0 of the TXYZ program, TXYZ 30, and the thermal multilayer program, TML /

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書目詳細資料
主要作者: Albers, John
企業作者: National Institute of Standards and Technology (U.S.)
格式: 圖書
語言:English
出版: Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1995.
叢編:NIST special publication ; 400-96.
Semiconductor measurement technology.
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持有資料詳情 CARM 1 Store
索引號: A3:AE21D0 F06324
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