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Proceedings /

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Bibliographic Details
Previous Title:International Test Conference. Digest of papers
Corporate Authors: International Test Conference, IEEE Computer Society. Test Technology Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format: Conference Proceeding Journal
Language:English
Published: Silver Spring, Md. : IEEE Computer Society Press, 1983-.
Subjects:
Computer storage devices > Congresses.
Integrated circuits > Testing > Congresses.
Semiconductors > Testing > Congresses.

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