Test structure implementation document : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) /
Wedi'i Gadw mewn:
| Prif Awdur: | |
|---|---|
| Awduron Corfforaethol: | , |
| Fformat: | Llyfr |
| Iaith: | English |
| Cyhoeddwyd: |
Gaithersburg, MD : Washington, DC :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1995.
|
| Cyfres: | Semiconductor measurement technology
NIST special publication. |
| Pynciau: |
CARM 1 Store
| Rhif Galw: |
A3:AE31E0 F06481 |
|---|---|
| Copi 1 | Ar gael Gwneud Cais |