Test structure implementation document : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) /
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| Main Author: | |
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| Corporate Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Gaithersburg, MD : Washington, DC :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1995.
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| Series: | Semiconductor measurement technology
NIST special publication. |
| Subjects: |
| Item Description: | "September 1995." |
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| Physical Description: | iv, 88 p. : ill. ; 28 cm. |
| Bibliography: | Includes bibliographical references (p. 14) |