Test structure implementation document : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) /
保存先:
第一著者: | |
---|---|
共著者: | , |
フォーマット: | 図書 |
言語: | English |
出版事項: |
Gaithersburg, MD : Washington, DC :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1995.
|
シリーズ: | Semiconductor measurement technology
NIST special publication. |
主題: |
記述事項: | "September 1995." |
---|---|
物理的記述: | iv, 88 p. : ill. ; 28 cm. |
書誌: | Includes bibliographical references (p. 14) |