Test structure implementation document : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) /

Test structure implementation document : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) /

保存先:
書誌詳細
第一著者: Schuster, C. E.
共著者: United States. Defense Advanced Research Projects Agency, U.S. Air Force Wright Laboratory
フォーマット: 図書
言語:English
出版事項: Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1995.
シリーズ:Semiconductor measurement technology
NIST special publication.
主題:
Microwave integrated circuits > Design > Data processing.
Gallium arsenide semiconductors > Design > Data processing.
Computer-aided design.
その他の書誌記述
記述事項:"September 1995."
物理的記述:iv, 88 p. : ill. ; 28 cm.
書誌:Includes bibliographical references (p. 14)

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